Edin Sijercic
3Patents
1h-index
6Co-inventors
27Inventor score
Filing activity: Jun 22, 2018 → Jun 13, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11156637B2 | Electrical test probes having decoupled electrical and mechanical design | Physics | 2 | Active |
| US11460485B2 | Direct metalized guide plate | Physics | 0 | Active |
| US10527647B2 | Probe head with inductance reducing structure | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.