Patent · US Active

Electronic device test database generating method and electronic device test database generating apparatus

US11163003B2 · kind B2 · utility

0Cited by

1References

17Claims

0Family size

Assignee

REALTEK SEMICONDUCTOR CORP. · TW

Inventors

Po-Lin Chen · Nanhu, CN
Ying-Yen Chen · Hsinchu, TW
Chia-Tso Chao · Goleta, US
Tse-Wei Wu · Hsinchu, TW

Key dates

Filing date	Nov 28, 2018
Grant date	Nov 2, 2021
Priority date	—
Expiry date	Jan 9, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG06F30/398
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An electronic device test database generating method, comprising: (a) acquiring cell layout information of a target electronic device; (b) generating possible defect location information of the target electronic device according to the cell layout information, wherein the possible defect location information comprises at least one possible defect location of the target electronic device; (c) testing the target electronic device according to the possible defect location information to generate a testing result; and (d) generating an electronic device test database according to the testing result.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.