Measurement method and apparatus
US11163288B2 · kind B2 · utility
1Cited by
6References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2016 |
| Grant date | Nov 2, 2021 |
| Priority date | — |
| Expiry date | Mar 30, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B19/4083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is described for analysing probe data collected by a scanning probe carried by a machine tool. The probe data is collected as the machine tool moves or scans the scanning probe along a scan path relative to a workpiece. The method includes a step of identifying a property of the scan path used by the machine tool from a characteristic of the collected probe data. In this manner, the scan path can be identified from the probe data alone without having to receive any position data from the machine tool.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.