Patent · US Active

Diagnostic device and method to establish degradation state of electrical connection in power semiconductor device

US11169201B2 · kind B2 · utility

4Cited by
1References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 30, 2018
Grant dateNov 9, 2021
Priority date—
Expiry dateDec 7, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/327
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method to establish a degradation state of electrical connections in a power semiconductor device comprising:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.