Nicolas DEGRENNE
14Patents
2h-index
6Co-inventors
39Inventor score
Filing activity: Jun 14, 2016 → Oct 23, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11169201B2 | Diagnostic device and method to establish degradation state of electrical connection in power semiconductor device | Physics | 4 | Active |
| US11474146B2 | Method for estimating degradation of a wire-bonded power semi-conductor module | Physics | 2 | Active |
| US10705133B2 | Method and device for estimating level of damage or lifetime expectation of power semiconductor module | Physics | 2 | Active |
| US10622281B2 | Power module and method for manufacturing power module | Electricity | 1 | Active |
| US10782338B2 | Method and device for estimating level of damage or lifetime expectation of power semiconductor module | Electricity | 1 | Active |
| US11378612B2 | Device and method for monitoring the health of a power semiconductor die | Physics | 0 | Active |
| US11927619B2 | Power semi-conductor module, mask, measurement method, computer software, and recording medium | Electricity | 0 | Active |
| US10827619B2 | Printed circuit board and method for manufacturing printed circuit board | Electricity | 0 | Active |
| US10495681B2 | System and method for determining if deterioration occurs in interface of semiconductor die of electric power module | Physics | 0 | Active |
| US12013428B2 | Method and device for monitoring gate signal of power semiconductor | Electricity | 0 | Active |
| US12270715B2 | Method for estimating parameters of a junction of a power semi-conductor element and power unit | Physics | 0 | Active |
| US10732617B2 | Method, device and system for estimating level of damage of electric device using histograms | Physics | 0 | Active |
| US11217378B2 | Inductive assembly and method of manufacturing inductive assembly | Electricity | 0 | Active |
| US11152934B2 | Device and method for controlling switching | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.