Temperature-independent verifying of structural integrity of materials using electrical properties
US11181498B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2017 |
| Grant date | Nov 23, 2021 |
| Priority date | — |
| Expiry date | Dec 28, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for detecting a crack or defect in a material are described. An example method may include determining, by a computing device, for each respective adjacent pair of electrodes of a plurality of electrodes electrically coupled to the material, a respective electrode pair voltage. The method also may include determining, by the computing device, for each respective adjacent pair of electrodes, a respective temperature-corrected electrode pair value based on the respective electrode pair voltage and at least one of a respective control voltage associated with the respective adjacent pair of electrodes or a temperature correction factor. The method may further include determining, by the computing device, whether the material includes a crack or defect based on the plurality of respective temperature-corrected electrode pair values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.