Patent · US Active

Error detection and correction using machine learning

US11205498B1 · kind B1 · utility

3Cited by
0References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 8, 2020
Grant dateDec 21, 2021
Priority date
Expiry dateJul 8, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M13/6325
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory system including a memory device and a memory controller including a processor. The memory controller is configured to read outputs from the memory cells in response to a read command from a host and to convert the read outputs to a first codeword. The processor performs a first error correcting code (ECC) operation on the first codeword. The processor is further configured to apply, for each selected memory cell among the memory cells, a corresponding one of the read outputs and at least one related feature as input features to a machine learning algorithm to generate a second codeword, and the memory controller is configured to perform a second ECC operation on the second codeword, when the first ECC operation fails.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.