Patent · US Active

Methods for cleaning semiconductor device manufacturing apparatus

US11211232B2 · kind B2 · utility

1Cited by
1References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 30, 2019
Grant dateDec 28, 2021
Priority date
Expiry dateApr 30, 2039

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA01D5/00
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present disclosure describes a chuck-based device and a method for cleaning a semiconductor manufacturing system. The semiconductor manufacturing system can include a chamber with the chuck-based device configured to clean the chamber, a loading port coupled to the chamber and configured to hold one or more wafer storage devices, and a control device configured to control a translational displacement and a rotation of the chuck-based device. The chuck-based device can include a based stage, one or more supporting rods disposed at the base stage and configured to be vertically extendable or retractable, and a padding film disposed on the one or more supporting rods.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.