Che-Fu Chen
30Patents
2h-index
20Co-inventors
49Inventor score
Filing activity: Jan 12, 2018 → May 15, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11004713B2 | Robot arm device and method for transferring wafer | Physics | 3 | Active |
| US11177183B2 | Thickness measurement system and method | Electricity | 2 | Active |
| US10283393B1 | Wafer carrying fork, semiconductor device manufacturing system, and wafer transporting method | Electricity | 2 | Active |
| US10978333B2 | Systems and methods for robotic arm sensing | Electricity | 1 | Active |
| US11600517B2 | Screwless semiconductor processing chambers | Electricity | 1 | Active |
| US12027594B2 | Method of manufacturing a semiconductor device and a semiconductor device | Electricity | 1 | Active |
| US11101163B2 | Systems and methods for automated robotic arm sensing | Electricity | 1 | Active |
| US11756840B2 | Reflectance measurement system and method thereof | Physics | 1 | Active |
| US11211232B2 | Methods for cleaning semiconductor device manufacturing apparatus | Human Necessities | 1 | Active |
| US11443966B2 | Semiconductor processing flow field control apparatus and method | Electricity | 1 | Active |
| US12420314B2 | Semiconductor cleaning apparatus and method | Electricity | 0 | Active |
| US12165909B2 | Screwless semiconductor processing chambers | Electricity | 0 | Active |
| US11779949B2 | Semiconductor process chamber contamination prevention system | Electricity | 0 | Active |
| US12090503B2 | Semiconductor process chamber contamination prevention system | Electricity | 0 | Active |
| US12414347B2 | Method of manufacturing a semiconductor device and a semiconductor device | Electricity | 0 | Active |
| US10811290B2 | Systems and methods for inspection stations | Electricity | 0 | Active |
| US12068398B2 | Fin field-effect transistor with void and method of forming the same | Electricity | 0 | Active |
| US11139149B2 | Gas injector | Electricity | 0 | Active |
| US11664260B2 | Systems and methods for orientator based wafer defect sensing | Electricity | 0 | Active |
| US11837484B2 | Robot arm device and method for transferring wafer | Physics | 0 | Active |
| US11177150B2 | Cluster tool and method using the same | Electricity | 0 | Active |
| US11664265B2 | Systems and methods for robotic arm sensing | Electricity | 0 | Active |
| US11521884B2 | Electrostatic chuck sidewall gas curtain | Electricity | 0 | Active |
| US11710620B2 | Semiconductor process chamber with heat pipe | Electricity | 0 | Active |
| US12040205B2 | Systems and methods for inspection stations | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.