Method for determining a temperature without contact, and infrared measuring system

US11215509B2 · kind B2 · utility

Assignee

• Robert Bosch GmbH · DE

Inventors

• Michael Frank · Bretten, DE
• Volkmar Senz · Metzingen, DE
• Michael Badeja · Leonberg, DE
• Axel Rumberg · Karlsruhe, DE
• Michael Krueger · Littleton, US
• Helge Dittmer · Hamburg, DE

Key dates

• Filing date: Jun 14, 2017
• Grant date: Jan 4, 2022
• Expiry date: Sep 8, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2005/202
• WIPO field: Audio-visual technology
• WIPO sector: Electrical engineering

Abstract

A method and an infrared measuring system for determining a temperature distribution of a surface without contact includes an infrared detector array with a detector array substrate and respective pluralities of measuring pixels and reference pixels. The measuring pixels are each connected to the detector array substrate with a first thermal conductivity, are sensitive to infrared radiation, and each provide a measurement signal for determining a temperature measurement value that depends on the intensity of the incident infrared radiation. The reference pixels are each connected to the detector array substrate with a second thermal conductivity and each provide a measurement signal for determining a temperature measurement value. The reference pixels are implemented as blind pixels that are substantially insensitive to infrared radiation. The temperature measurement values of the measuring pixels are corrected by a pixel-associated temperature drift component determined with reference to the temperature measurement values of the reference pixels.