Patent · US Active

Non-invasive on-chip power measurement technique

US11215664B1 · kind B1 · utility

1Cited by

4References

20Claims

0Family size

Assignee

Apple Inc. · US

Inventors

Ke Yun · San Jose, US
Weibiao Zhang · Plano, US
Bruno W. Garlepp · San Jose, US
Gin Yee · Sunnyvale, US

Key dates

Filing date	Jun 19, 2020
Grant date	Jan 4, 2022
Priority date	—
Expiry date	Jun 20, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2884
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An apparatus includes an integrated circuit that includes an in-circuit power switch coupled to a power supply node, a functional circuit coupled between the in-circuit power switch and a ground node, a test circuit, and a test power switch coupled to the test circuit, wherein the test power switch is a replica of the in-circuit power switch. The test circuit is configured to determine characteristics of the test power switch, and to measure a voltage difference across the in-circuit power switch. The test circuit is also configured to use the characteristics of the test power switch and the voltage difference to determine a power consumption of the functional circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.