Microscope and method for viewing a specimen using a microscope

US11226478B2 · kind B2 · utility

Assignee

• Carl Zeiss Microscopy GmbH · DE

Inventors

• Alexander GAIDUK · Jena, DE
• Dominik Stehr · Jena, DE
• Johannes Winterot · Jena, DE
• Volker PUSCH · Hüttlingen, DE

Key dates

• Filing date: Jan 12, 2018
• Grant date: Jan 18, 2022
• Expiry date: Jan 12, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G06V20/695
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

The present invention relates to a method for viewing a specimen using a microscope which comprises an objective lens and an image sensor for converting an image formed on the image sensor by the objective lens. A field of view of the microscope can be varied by selecting a section of the image sensor. In one step of the method, an initial image of at least a partial section of the specimen is captured with the microscope, for which a first field of view is selected on the microscope. The initial image is analyzed to determine at least two differing fields of view forming a partial area image, wherein a partial area of the initial image is formed by each of the fields of view forming a partial area image. Images of the partial areas of the specimen are captured for each of the determined fields of view forming a partial area image. The invention further relates to a microscope for viewing a specimen using a microscope.