Patent · US Active

Threshold estimation in NAND flash devices

US11232842B2 · kind B2 · utility

0Cited by
3References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 18, 2020
Grant dateJan 25, 2022
Priority date
Expiry dateNov 18, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/56008
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for determining an optimal threshold of a nonvolatile memory device, the method including: reading a page from a nonvolatile memory device with a default threshold and attempting to hard decode the page using the default threshold; reading the page two more times with a predetermined offset voltage when the hard decoding fails and attempting to soft decode the page using the default threshold; approximating an empirical distribution of successfully decoded bits with a Gaussian distribution for each level; finding an intersection of the Gaussian distributions; and setting the intersection as a new reading threshold and reading the page again with the new reading threshold.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.