Patent · US Active

System and method for binning at final test

US11235355B2 · kind B2 · utility

0Cited by

10References

20Claims

0Family size

Assignee

OPTIMAL PLUS LTD. · IL

Inventors

Reed Linde · Cameron Park, US
Gill Balog · Jerusalem, IL

Key dates

Filing date	Oct 24, 2018
Grant date	Feb 1, 2022
Priority date	—
Expiry date	Jul 19, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2894
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Systems and methods for sorting an electronic device undergoing a final test operation in accordance with a test program, into one of a plurality of bins. In one embodiment, an evaluator defines the binning of the electronic device while the device is still socketed, and the defined binning may or may not concur with the binning assigned by the test program.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.