Automatic analyzer
US11237182B2 · kind B2 · utility
0Cited by
1References
9Claims
0Family size
Assignee
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Key dates
| Filing date | Jan 23, 2017 |
| Grant date | Feb 1, 2022 |
| Priority date | — |
| Expiry date | Jan 27, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/0453
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To clean a reagent probe 7a, 8a or a sample probe 11a, 12a with a heated cleaning solution, after a first cleaning solution is caused to overflow from a first cleaning container 23 or a second cleaning container 24, the first cleaning solution is temporarily drawn back into the cleaning-solution heating passage 125 to be heated by the heating mechanism 123. After the heating, the first cleaning solution thus heated is re-supplied to the first cleaning container 23 or the second cleaning container 24. As a result, the cleaning solution heated to clean a dispensing probe can be supplied to a cleaning bath with efficiency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.