Scanning probe and electron microscope probes and their manufacture
US11237188B2 · kind B2 · utility
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5References
17Claims
0Family size
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Key dates
| Filing date | Jul 20, 2018 |
| Grant date | Feb 1, 2022 |
| Priority date | — |
| Expiry date | Jul 20, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2818
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.