Verifying structural integrity of materials
US11255807B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2017 |
| Grant date | Feb 22, 2022 |
| Priority date | — |
| Expiry date | Feb 27, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system may include control electronics; an electrical signal source; a plurality of measurement system electrical contacts; at least one feature for repeatably electrically connecting the plurality of measurement system electrical contacts to selected locations of a tested material. The control electronics may be configured to cause the electrical signal source to output an electrical signal; determine a measured voltage in response to the electrical signal using a measurement electrical contact from the plurality of measurement system electrical contacts. The measurement electrical contact is electrically coupled to the tested material. The control electronics also may be configured to determine whether the tested material includes a crack or other defect based on the measured voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.