Patent · US Active

Read count scaling factor for data integrity scan

US11287998B2 · kind B2 · utility

3Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 2, 2019
Grant dateMar 29, 2022
Priority date
Expiry dateSep 23, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3431
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A processing device in a memory system receives a first read request from a host system, wherein the first read request is directed to first data stored at a first address in a block of the memory component. The processing device determines that the first address is located within a first region of the block and increments a read counter for the block by a default amount. The processing device further receives a second read request from the host system, wherein the second read request is directed to second data stored at a second address in a block of the memory component, determines that the second address is located within a second region of the block and increments the read counter for the block by a scaled amount.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.