Integrated circuit testing for integrated circuits with antennas
US11293968B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 12, 2020 |
| Grant date | Apr 5, 2022 |
| Priority date | — |
| Expiry date | May 12, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing system and method for testing integrated circuits with radio frequency (RF) antennas is disclosed. The system includes an alignment plate for receiving a device under test (DUT) having an RF transmitting antenna, an enclosure surrounding but separated from the transmitting antenna, a receiving antenna in a telescopic enclosure, and a conversion circuit connected to the receiving antenna. The conversion circuit is configured to convert an RF output from the DUT to a direct current (DC) voltage. The DC voltage is used as a proxy for the RF output to test the DUT. When testing chips with RF ports, the chip or ports are surrounded by the enclosure which is non-radio reflective and includes antennas for receiving RF outputs disbursed around the enclosure, or a single antenna. If multiple receiving antennas are used, sequential testing can also detect directional transmission patterns to confirm that the direction is correctly calibrated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.