Pupil-plane beam scanning for metrology
US11300524B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 6, 2021 |
| Grant date | Apr 12, 2022 |
| Priority date | — |
| Expiry date | Jan 6, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03F7/706851
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A metrology measurement apparatus may include one or more illumination sources, a beamsplitter configured to receive illumination from the one or more illumination sources from an illumination pathway and direct the illumination along a measurement pathway, and an objective lens. The objective lens may direct the illumination from the measurement pathway to a sample, collect light from the sample, and direct the collected light along the measurement pathway to the beamsplitter such that the beamsplitter may direct the collected light along a collection pathway to a detector. The apparatus may further include a pupil-plane scanner along the measurement pathway with a pupil relay and a deflector in a relayed pupil plane such that adjusting the deflector adjusts a position of the illumination spot on the sample without modifying a position of the illumination pupil distribution or a position of a distribution of the collected light along the collection pathway.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.