Avi Abramov
13Patents
3h-index
47Co-inventors
56Inventor score
Filing activity: Feb 22, 2013 → Feb 27, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10203247B2 | Systems for providing illumination in optical metrology | Electricity | 9 | Active |
| US11300524B1 | Pupil-plane beam scanning for metrology | Physics | 6 | Active |
| US10677588B2 | Localized telecentricity and focus optimization for overlay metrology | Physics | 4 | Active |
| US9512985B2 | Systems for providing illumination in optical metrology | Electricity | 2 | Active |
| US9341769B2 | Spectral control system | Physics | 2 | Active |
| US11156846B2 | High-brightness illumination source for optical metrology | Physics | 1 | Active |
| US12001148B2 | Enhancing performance of overlay metrology | Electricity | 1 | Active |
| US11592755B2 | Enhancing performance of overlay metrology | Electricity | 1 | Active |
| US12111580B2 | Optical metrology utilizing short-wave infrared wavelengths | Physics | 0 | Active |
| US11662562B2 | Broadband illumination tuning | Physics | 0 | Active |
| US9719940B2 | Compressive sensing with illumination patterning | Physics | 0 | Active |
| US11187838B2 | Spectral filter for high-power fiber illumination sources | Physics | 0 | Active |
| US9921050B2 | Spectral control system | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.