Patent · US Active

Waveguide integrated circuit testing

US11307232B1 · kind B1 · utility

1Cited by

0References

19Claims

0Family size

Assignee

Johnstech International Corporation · US

Inventors

Jeffrey C. Sherry · Savage, US
Cory Kostuchowski · Wyoming, US

Key dates

Filing date	Feb 20, 2020
Grant date	Apr 19, 2022
Priority date	—
Expiry date	Aug 7, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/303
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A structure and method for providing a housing which includes a high frequency (HF or RF) connection between a device under test (DUT) having a waveguide 22. The waveguide includes a wave insert 22, and a conductive compliant member 40 which maintains bias between the adapter/insert 22 and the DUT HF port 20 while also maintaining an RF shield despite the variable height of the DUT waveport. A passage 50 provides an RF connection between the RF port 62 on the DUT and a RF wave guide horn 54. A plurality of transmitting horns 54 can be arranged to transmit to a single receiving horn 154 so that fewer receivers are required to test multiple DUTs in sequence.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.