Method for generating and analyzing an overview contrast image

US11307398B2 · kind B2 · utility

Assignee

• Carl Zeiss Microscopy GmbH · DE

Inventors

• Daniel Haase · Zöllnitz, DE
• Thomas Ohrt · Golmsdorf, DE
• Markus Sticker · Jena, DE

Key dates

• Filing date: May 15, 2018
• Grant date: Apr 19, 2022
• Expiry date: Nov 5, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B21/367
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A method for generating and analyzing an overview contrast image of a specimen carrier and/or of specimens situated on a specimen carrier. A specimen carrier arranged at least partially in the focus of a detection optical unit is illuminated in transmitted light using a two-dimensional, array-like illumination pattern. At least two overview raw images are detected using different illuminations of the specimen carrier, and, according to information to be extracted from the overview contrast image, a combination algorithm is selected by means of which the at least two overview raw images are combined to form the overview contrast image. According to information to be extracted from the overview contrast image, an image evaluation algorithm is selected by means of which the information is extracted.