Cell-aware defect characterization by considering inter-cell timing
US11334698B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 29, 2021 |
| Grant date | May 17, 2022 |
| Priority date | — |
| Expiry date | Apr 29, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is cell-aware defect characterization by considering inter-cell timing. Also disclosed is a method and apparatus that determines whether a defect can be detected in a standard library cell used to design an integrated circuit. A defect detection table is generated that indicates whether particular defects can be detected with particular combinations of input logic states and under varying load conditions. Results are merged to provide a single metric for each combination of input and output logic states that indicates one of three possible results for each defect: (1) whether the defect can be detected under all load conditions, (2) whether the defect can be detected only under some load conditions; or (3) whether the defect cannot be detected for the particular combination of input logic states regardless of the load conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.