Method and system for fabrication of a vertical fin-based field effect transistor
US11335810B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 15, 2020 |
| Grant date | May 17, 2022 |
| Priority date | — |
| Expiry date | Jul 15, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/64
Abstract
A transistor includes a substrate having a first surface and a second surface opposite the first surface, a drift region having a doped region on the first surface of the substrate and a graded doping region on the doped region, a semiconductor fin protruding from the graded doping region and comprising a metal compound layer at an upper portion of the semiconductor fin, a source metal contact on the metal compound layer, a gate layer having a bottom portion directly contacting the graded doping region; and a drain metal contact on the second surface of the substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.