Method for controlling an x-ray source
US11350512B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 7, 2019 |
| Grant date | May 31, 2022 |
| Priority date | — |
| Expiry date | Jun 7, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2235/082
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for controlling an X-ray source configured to emit, from an X-ray spot on a target, X-ray radiation generated by an interaction between an electron beam and the target, wherein the X-ray spot is determined by the field of view of an X-ray optical system of the X-ray source. The method includes providing the target, providing the electron beam forming an electron spot on the target and interacting with the target to generate X-ray radiation, and adjusting a width and total power of the electron beam such that a maximum of the power density profile in the electron spot is below a predetermined limit, and such that a total power delivered to the target in the X-ray spot is increased.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.