Patent assignee · SE · COMPANY

Excillum AB

26Patents
26Active
26Granted
47Portfolio score

Filing activity: Jan 26, 2009 → Jan 17, 2023 · 2 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US9380690B2 Aligning and focusing an electron beam in an X-ray source Electricity 4 Active
US10818468B1 Liquid target X-ray source with jet mixing tool Electricity 3 Active
US8837679B2 Supply of a liquid-metal target in X-ray generation Electricity 3 Active
US10971323B1 Semiconductor X-ray target Electricity 2 Active
US11579318B2 Characterization of an electron beam Electricity 1 Active
US9947502B2 Aligning and focusing an electron beam in an X-ray source Electricity 1 Active
US9245707B2 Coated X-ray window Electricity 1 Active
US10784069B2 Structured x-ray target Electricity 1 Active
US11342154B2 X-ray source and method for generating x-ray radiation Electricity 0 Active
US12310775B2 X-ray system Electricity 0 Active
US9564283B2 Limiting migration of target material Electricity 0 Active
US10825642B2 X-ray source with ionisation tool Electricity 0 Active
US11651927B2 Electron collector with oblique impact portion Electricity 0 Active
US11910515B2 X-ray source with an electromagnetic pump Electricity 0 Active
US9171693B2 Coated X-ray window Electricity 0 Active
US9530607B2 Supply of a liquid-metal target in X-ray generation Electricity 0 Active
US11742171B2 Method for imaging a sample Physics 0 Active
US11800625B2 Mechanical alignment of x-ray sources Electricity 0 Active
US10930464B2 Vapour monitoring Electricity 0 Active
US8681943B2 X-ray window Electricity 0 Active
US11979972B2 X-ray source with an electromagnetic pump Electricity 0 Active
US11350512B2 Method for controlling an x-ray source Electricity 0 Active
US11963286B2 X-ray source and method for generating X-ray radiation Electricity 0 Active
US11257651B2 Determining width and height of electron spot Electricity 0 Active
US11892576B2 Characterization of an electron beam Electricity 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.