Patent · US Active

Stitching-measurement device and stitching-measurement method

US11365964B2 · kind B2 · utility

0Cited by
1References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 5, 2018
Grant dateJun 21, 2022
Priority date
Expiry dateDec 5, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2210/52
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed is a stitching-measurement device adapted for performing stitching-measurement on a surface of a concave spherical lens, including: an interferometer, a reference lens, a first plane mirror, a second plane mirror, a first adjustment mechanism, a second adjustment mechanism, a concave spherical object to be measured, a motion table and a control mechanism, the first plane mirror being mounted on the first adjustment mechanism configured to change a position of the first plane mirror; the second plane mirror being mounted on the second adjustment mechanism configured to change a position of the second plane mirror; the concave spherical object to be measured being placed on the motion table configured to change a position of the concave spherical object to be measured; the control mechanism communicating with the interferometer, the first adjustment mechanism, the second adjustment mechanism, and the motion table for issuing control signals, wherein by the first adjustment mechanism and the second adjustment mechanism, an included angle between the first plane mirror and the second plane mirror is adjusted in such a way that light beam incident on the concave spherical obje…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.