Patent · US Active

Plasma processing method and plasma processing apparatus

US11380547B2 · kind B2 · utility

0Cited by
0References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 30, 2020
Grant dateJul 5, 2022
Priority date
Expiry dateOct 30, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/3341
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A plasma processing method of etching an organic film through a mask having an opening is provided. The mask is formed on the organic film, and is made of a silicon-containing film. The method includes rectifying a shape of the mask. The rectifying of the shape of the mask includes refining a side wall of the opening of the mask, and etching an upper surface of the mask.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.