Repurposed seed layer for high frequency noise control and electrostatic discharge connection
US11380613B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 29, 2020 |
| Grant date | Jul 5, 2022 |
| Priority date | — |
| Expiry date | Jun 20, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/151
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
An integrated circuit (IC) package is described. The IC package includes a die, having a pad layer structure on back-end-of-line layers on a substrate. The die also includes a metallization routing layer on the pad layer structure, and a first under bump metallization layer on the metallization routing layer. The IC package also includes a patterned seed layer on a surface of the die to contact the first under bump metallization layer. The IC package further includes a first package bump on the first under bump metallization layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.