Probe member for pogo pin, method of manufacturing the probe member, pogo pin comprising the probe member
US11385259B2 · kind B2 · utility
0Cited by
4References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 22, 2018 |
| Grant date | Jul 12, 2022 |
| Priority date | — |
| Expiry date | Nov 25, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R3/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe member for a pogo pin, a method of manufacturing the probe member, and a pogo pin including the probe member are disclosed. The probe member for the pogo pin has a contact portion including a material having hardness greater than the hardness of a first body portion and a second body portion, and each of the first and second body portions includes a material having electrical conductivity equal to or greater than 50% IACS (International Annealed Copper Standard).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.