ISC CO., LTD.
17Patents
15Active
17Granted
48Portfolio score
Filing activity: Jun 20, 1994 → Dec 23, 2020 · 3 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5437410A | Passive fragrance dispenser | Emerging Cross-Sectional Technologies | 88 | Expired |
| US6499033B1 | Database method and apparatus using hierarchical bit vector index structure | Emerging Cross-Sectional Technologies | 41 | Expired |
| US9547023B2 | Test probe for test and fabrication method thereof | Emerging Cross-Sectional Technologies | 9 | Active |
| US9726693B2 | Probe member for pogo pin | Physics | 4 | Active |
| US9310395B2 | Probe member for pogo pin | Physics | 4 | Active |
| US9759742B2 | Test socket including conductive particles in which through-holes are formed and method for manufacturing same | Electricity | 4 | Active |
| US9696344B2 | Test socket which allows for ease of alignment | Electricity | 3 | Active |
| US8610447B2 | Spring structure and test socket using thereof | Electricity | 3 | Active |
| US8727328B2 | Insert for handler | Physics | 3 | Active |
| US9488675B2 | Test socket having high-density conductive unit, and method for manufacturing same | Electricity | 2 | Active |
| US11073536B2 | ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly | Electricity | 1 | Active |
| US9423419B2 | Test socket including electrode supporting portion and method of manufacturing test socket | Emerging Cross-Sectional Technologies | 1 | Active |
| US11442079B2 | Contact device for electrical test | Physics | 0 | Active |
| US11385259B2 | Probe member for pogo pin, method of manufacturing the probe member, pogo pin comprising the probe member | Physics | 0 | Active |
| US8702269B2 | Outdoor lamp | Emerging Cross-Sectional Technologies | 0 | Active |
| US10509383B2 | Control system for operating grain bin systems | Emerging Cross-Sectional Technologies | 0 | Active |
| US11555829B2 | Probe member for pogo pin, manufacturing method therefor and pogo pin comprising same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.