Patent · US Active

Device, method and system of error detection and correction in multiple devices

US11385288B2 · kind B2 · utility

0Cited by

5References

28Claims

0Family size

Assignee

STMicroelectronics SA

Inventors

Ricardo Gomez Gomez · Grenoble, FR
Sylvain Clerc · Grenoble, FR

Key dates

Filing date	Sep 24, 2020
Grant date	Jul 12, 2022
Priority date	—
Expiry date	Sep 24, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31816
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method tests at least three devices, each device including a test chain having a plurality of positions storing test data. The testing includes comparing test data in a last position of the test chain of each of the devices, and shifting test data in the test chains of each of the devices and storing a result of the comparison in a first position of the test chains of each of the devices. The comparing and the shifting and storing are repeated until all the stored test data has been compared. The at least three devices may have a same functionality and a same structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.