Patent · US Active

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US11387235B2 · kind B2 · utility

5Cited by
11References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 19, 2020
Grant dateJul 12, 2022
Priority date
Expiry dateAug 19, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/201

Abstract

Systems, methods, and apparatus for an improved protection from charge injection into layers of a device using resistive structures are described. Such resistive structures, named s-contacts, can be made using simpler fabrication methods and less fabrication steps. In a case of metal-oxide-semiconductor (MOS) field effect transistors (FETs), s-contacts can be made with direct connection, or resistive connection, to all regions of the transistors, including the source region, the drain region and the gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.