Patent · US Active

Three-dimensional shape measurement system and three-dimensional shape measurement method

US11389967B2 · kind B2 · utility

0Cited by
2References
13Claims
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Inventor

Key dates

Filing dateJan 24, 2020
Grant dateJul 19, 2022
Priority date
Expiry dateNov 22, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30164
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A three-dimensional shape measurement system includes: an articulated robot having a plurality of axes; at least one three-dimensional vision sensor mounted to the articulated robot and configured to measure a three-dimensional shape of an object to be imaged; a storage unit configured to store distance images representing the three-dimensional shape measured respectively in a plurality of measurement areas including an overlap region; and an integrating unit configured to integrate the plurality of distance images stored in the storage unit in such a manner that parts of the distance images corresponding to the overlap region are superimposed on each other, to thereby generate an integrated distance image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.