Inventor · Yokohama, JP

Jun Wada

16Patents
9h-index
16Co-inventors
69Inventor score

Filing activity: Apr 24, 1990 → Jan 24, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US5731634A Semiconductor device having a metal film formed in a groove in an insulating film Electricity 61 Expired
US5076963A Pastes for forming a luminescent layer and insulator layer of electroluminescent element and electroluminescent element using such pastes Chemistry; Metallurgy 33 Expired
US5561082A Method for forming an electrode and/or wiring layer by reducing copper oxide or silver oxide Electricity 32 Expired
US5424246A Method of manufacturing semiconductor metal wiring layer by reduction of metal oxide Electricity 31 Expired
US5629236A Method of manufacture of semiconductor device Electricity 29 Expired
US5923072A Semiconductor device with metallic protective film Electricity 26 Expired
US6242327A Compound semiconductor device having a reduced source resistance Electricity 26 Expired
US6054770A Electric solid state device and method for manufacturing the device Electricity 21 Expired
US5532507A MES field effect transistor possessing lightly doped drain Electricity 9 Expired
US10722992B2 Workpiece placement system for placing workpiece in containment area or on jig Physics 4 Active
US9129970B2 Semiconductor device having oxidized Ti- and N-containing layer, and manufacturing of the same Electricity 2 Active
US10518417B2 Article retrieval system Physics 1 Active
US6639300B2 Semiconductor integrated circuit having an integrated resistance region Electricity 1 Expired
US9343402B2 Semiconductor device having Ti- and N-containing layer, and manufacturing method of same Electricity 1 Active
US11389967B2 Three-dimensional shape measurement system and three-dimensional shape measurement method Physics 0 Active
US11835516B2 Determination method and kit for determining possibility of reduced renal function Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.