Measurement of crystallite size distribution in polycrystalline materials using two-dimensional X-ray diffraction
US11397154B2 · kind B2 · utility
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10Claims
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Key dates
| Filing date | Jul 27, 2020 |
| Grant date | Jul 26, 2022 |
| Priority date | — |
| Expiry date | Feb 18, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/641
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray diffraction method measures crystallite size distribution in a polycrystalline sample using an X-ray diffractometer with a two-dimensional detector. The diffraction pattern collected contains several spotty diffraction rings. The spottiness of the diffraction rings is related to the size, size distribution and orientation distribution of the crystallites as well as the diffractometer condition. The invention allows obtaining of the diffraction intensities of all measured crystallites at perfect Bragg condition so that the crystallite size distribution can be measured based on the 2D diffraction patterns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.