Flexible ceramic coil circuit for high temperature non-destructive inspection
US11442042B2 · kind B2 · utility
1Cited by
8References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2019 |
| Grant date | Sep 13, 2022 |
| Priority date | — |
| Expiry date | Dec 5, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01F2017/006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a flexible coil circuit for a non-destructive inspection probe. The coil circuit is made of multiple layers of thin flexible ceramic material, each ceramic layer having a metallization layer deposited thereon. The circuit is capable of continuous operation at temperatures up to 350° C. The metallized layers are able to slide freely over one another as the probe is flexed, enabling the probe to conform to the circumference of pipes as small as 2 inches in diameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.