Patent · US Active

Isolation logic test circuit and associated test method

US11442108B1 · kind B1 · utility

2Cited by
5References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 16, 2021
Grant dateSep 13, 2022
Priority date
Expiry dateSep 16, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318555
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A circuit includes: a first power domain including: an isolation cell, a first selection circuit having inputs for receiving a first functional signal and a first test signal and an output for controlling the isolation cell, and a second selection circuit having inputs for receiving a second functional signal and a second test signal and an output coupled to a signal input of the isolation cell; a second power domain including: a first circuit having an input coupled to a signal output of the isolation cell, a first observation element coupled to the signal output of the isolation cell, and a second observation element coupled to an output of the first circuit; where, when in test mode, the first selection circuit controls the isolation cell based on the first test signal, and the second selection circuit provides the second test signal to the signal input of the isolation cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.