Patent · US Active

3D microscopy

US11454798B2 · kind B2 · utility

1Cited by
2References
18Claims
0Family size

Assignee

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Key dates

Filing dateMar 1, 2018
Grant dateSep 27, 2022
Priority date
Expiry dateJul 25, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/10056
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A microscopy method for three-dimensionally imaging an object, including imaging the object along a beam path into a first image on a first image plane. A first microlens array is arranged on the first image plane, and a second microlens array with the same pitch is arranged downstream of the first array. The two arrays laterally segment the first image and image same into a second image in which the segments are spaced apart and separated by gaps. On a pupil plane downstream of the microlens array, a provided phase mask generates a spot for each segment of the second image according to a pixel diffusion function. A detector detects the shape and structure of the spot, and a controller ascertains a lateral intensity distribution and depth specification from the shape and/or structure of the spot for each segment and generates a depth-resolved image of the object therefrom.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.