Processor-based measuring method for testing device under test, and measuring device using same
US11460502B2 · kind B2 · utility
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13Claims
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Key dates
| Filing date | Jun 7, 2018 |
| Grant date | Oct 4, 2022 |
| Priority date | — |
| Expiry date | Nov 25, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/52
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a measuring method for testing a device under test (DUT) having a plurality of terminals and, particularly, to a means for measuring the functions and performance of various electronic devices in which an electronic circuit such as that in an electronic device, a semiconductor element, a circuit module, and a circuit board is mounted, and to: a method by which a processor supports measurement with software such that unit costs can be reduced to be lower than those of conventional means operating with various, high-cost hardware; and a device using the same.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.