Byeong-Yun Kim
11Patents
5h-index
10Co-inventors
63Inventor score
Filing activity: Dec 17, 1987 → Oct 7, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5396113A | Electrically programmable internal power voltage generating circuit | Physics | 33 | Expired |
| US4972373A | Precharge system in a SRAM | Physics | 19 | Expired |
| US5121356A | Write driver having a precharging means | Physics | 12 | Expired |
| US5067109A | Data output buffer circuit for a SRAM | Physics | 10 | Expired |
| US5305279A | Semiconductor memory device having word line selection logic circuits | Physics | 6 | Expired |
| US7706198B2 | Multi-chip and repairing method based on remaining redundancy cells | Physics | 4 | Active |
| US7429794B2 | Multi-chip packaged integrated circuit device for transmitting signals from one chip to another chip | Electricity | 3 | Active |
| US11255886B2 | Current measurement apparatus including charge/discharge means and current measurement method using same | Physics | 0 | Active |
| US11320483B2 | Method for testing device under test and apparatus using the same | Physics | 0 | Active |
| US11686772B2 | Self diagnostic apparatus for electronic device | Physics | 0 | Active |
| US11460502B2 | Processor-based measuring method for testing device under test, and measuring device using same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.