Patent · US Active

Super resolution for magneto-optical microscopy

US11474283B2 · kind B2 · utility

0Cited by

10References

18Claims

0Family size

Assignee

UCHICAGO ARGONNE, LLC · US

Inventors

Suzanne Gabriëlle Everdine te Velthuis · Naperville, US
Michael Vogel · Nuremberg, DE
Axel Hoffmann · Berlin, DE

Key dates

Filing date	Jun 30, 2020
Grant date	Oct 18, 2022
Priority date	—
Expiry date	Jan 12, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/8848
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.