Methods and structure to probe the metal-metal interface for superconducting circuits
US11480537B2 · kind B2 · utility
0Cited by
1References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2020 |
| Grant date | Oct 25, 2022 |
| Priority date | — |
| Expiry date | Feb 8, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N60/80
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring contact resistance at an interface for superconducting circuits is provided. The method includes using a chain structure of superconductors to measure a contact resistance at a contact between contacting superconductor. The method further includes eliminating ohmic resistance from wire lengths in the chain structure by operating below the lowest superconducting transition temperature of all the superconductors in the chain structure. The measurement is dominated by contact resistances of the contacts between contacting superconductors in the chain.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.