Patent · US Active

Metrology system

US11486689B2 · kind B2 · utility

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0References
9Claims
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Assignee

Inventors

Key dates

Filing dateFeb 4, 2020
Grant dateNov 1, 2022
Priority date
Expiry dateDec 10, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B3/1048
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.