Analyzing data using a hierarchical structure
US11488378B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 9, 2017 |
| Grant date | Nov 1, 2022 |
| Priority date | — |
| Expiry date | Aug 21, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Apparatus, systems, and methods for analyzing data are described. The data can be analyzed using a hierarchical structure. One such hierarchical structure can comprise a plurality of layers, where each layer performs an analysis on input data and provides an output based on the analysis. The output from lower layers in the hierarchical structure can be provided as inputs to higher layers. In this manner, lower layers can perform a lower level of analysis (e.g., more basic/fundamental analysis), while a higher layer can perform a higher level of analysis (e.g., more complex analysis) using the outputs from one or more lower layers. In an example, the hierarchical structure performs pattern recognition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.