Analog-to-digital converter (ADC) testing
US11489535B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 11, 2021 |
| Grant date | Nov 1, 2022 |
| Priority date | — |
| Expiry date | May 11, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1019
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Body text indent—does not have paragraph numbering turned on. Not needed in the Abstract. An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic test mode, a digital to analog converter (DAC) configured to output an analog sine wave based on the output of the combiner circuit, and a test analog to digital converter (ADC) including an input terminal directly connected to the output of the DAC, and configured to generate a second digital sine wave based on the analog sine wave.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.