Inventor · Austin, TX, US

Xiankun Jin

16Patents
3h-index
11Co-inventors
49Inventor score

Filing activity: Jun 22, 2015 → Jul 5, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US9319033B1 Ramp voltage generator and method for testing an analog-to-digital converter Electricity 16 Active
US10505519B1 Dynamic comparator Electricity 7 Active
US9473164B1 Method for testing analog-to-digital converter and system therefor Electricity 4 Active
US9438262B1 Method for testing differential analog-to-digital converter and system therefor Electricity 3 Active
US10770457B2 Compensated alternating polarity capacitive structures Electricity 1 Active
US11585849B2 Apparatuses involving calibration of input offset voltage and signal delay of circuits and methods thereof Physics 1 Active
US11489535B1 Analog-to-digital converter (ADC) testing Electricity 1 Active
US11728336B2 Compensated alternating polarity capacitive structures Electricity 1 Active
US10866277B2 Analog-test-bus apparatuses involving calibration of comparator circuits and methods thereof Electricity 1 Active
US11418188B1 Bootstrapped switch Electricity 1 Active
US11561255B2 Systems and methods for detecting faults in an analog input/output circuitry Physics 1 Active
US11961577B2 Testing of on-chip analog-mixed signal circuits using on-chip memory Electricity 0 Active
US10474553B2 Built-in self test for A/D converter Electricity 0 Active
US10816595B2 Self-test apparatuses having distributed self-test controller circuits and controller circuitry to control self-test execution based on self-test properties and method thereof Physics 0 Active
US10359469B2 Non-intrusive on-chip analog test/trim/calibrate subsystem Physics 0 Active
US10345841B1 Current source with variable resistor circuit Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.