Automatic analyzer and optical measurement method
US11493430B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 13, 2019 |
| Grant date | Nov 8, 2022 |
| Priority date | — |
| Expiry date | Sep 13, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/127
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are an automatic analyzer and an optical measurement method for correcting a variation in the multiplication factor of a photoelectric element with high accuracy. The automatic analyzer comprises: a photoelectric element which generates electrons by light and outputs a current signal; a voltage application unit which applies a voltage to the photoelectric element; and a processing unit which corrects a variation in the multiplication factor of the photoelectric element, wherein the photoelectric element outputs a pulse signal as the current signal, and the processing unit corrects the variation in the multiplication factor on the basis of the pulse area of the pulse signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.