Methods and apparatuses for checking the confocality of a scanning and descanning microscope assembly
US11493744B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2021 |
| Grant date | Nov 8, 2022 |
| Priority date | — |
| Expiry date | Dec 15, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/62
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
For checking the confocality of a scanning and descanning microscope assembly comprising a light source providing illumination light focused into a focal area in a focal plane, a detector detecting light coming out of the focal area and having a detection aperture to be arranged in a confocal fashion with respect to the focal area, and a scanner, an auxiliary detection aperture of an auxiliary detector arranged in the focal plane is scanned with the focal area of the illumination light to record a first comparison intensity distribution of the illumination light registered by the auxiliary detector, and the detection aperture of the detector is scanned with auxiliary light that exits out of an auxiliary emission aperture of an auxiliary light source concentrically arranged with respect to the auxiliary detection aperture in the focal plane to record a second comparison intensity distribution of the auxiliary light registered by the detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.